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Backscattered scanning electron microscopy and image analysis of sediments and sedimentary rocks David H. Krinsley, Kenneth Pye, Sam Jr Boggs and N. Keith

By: Contributor(s): Material type: TextTextPublication details: Cambridge Cambridge University Press 2005Description: ix+193p. biblio, figs, indexISBN:
  • 0-521-01974-5
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Item type Current library Call number Status Date due Barcode
Books Prayagraj General Stack 552.086:552.5/KRI (Browse shelf(Opens below)) Available 007102

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